商品件数:2 1件~2件 (1ページ中 1ページめ)
X-Ray Metrology in Semiconductor Manufacturing
著者:D. Keith Bowen, Brian K. Tanner
出版社: CRC Press
発売日: 2019年02月11日
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanomete……続きを見る
価格:44,590円
Atomic Diffusion in III-V Semiconductors
著者:Brian Tuck
出版社: CRC Press
発売日: 2021年05月31日
III-V semiconductors, of which gallium arsenide is the best known, have been important for some years and appear set to become much more so in the future. They have principally contributed to two te……続きを見る
価格:14,806円

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