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Modern Interferometry for Length Metrology ［Exploring limits and novel techniques］

著者：Dr. Florian Pollinger, Dr. Arnold Nicolaus, Dr. Guido Bartl, Dr Thilo Schuldt, Dr. Nandini Bhattacharya, Dr. Steven van den Berg, Prof. Dr. Seung-Woo Kim, Dr. Yoon-Soo Jang, Prof. Dr. Armin Reichhold, Dr. Birk Andreas, Dr. Christoph Weichert
出版社： Institute of Physics Publishing
発売日： 2019年01月07日

Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology.……続きを見る

価格：20,192円

Seungwoo - General Physics 1