商品件数:4 1件~4件 (1ページ中 1ページめ)
Crystal Growth and Evaluation of Silicon for VLSI and ULSI
著者:Golla Eranna
出版社: CRC Press
発売日: 2024年03月01日
Silicon, as a single-crystal semiconductor, has sparked a revolution in the field of electronics and touched nearly every field of science and technology. Though available abundantly as silica and i……続きを見る
価格:13,982円
Advanced Laser Diode Reliability
著者:Massimo Vanzi, Mitsuo Fukuda, Giovanna Mura, Laurent Bechou
出版社: ISTE Press - Elsevier
発売日: 2021年07月24日
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physica……続きを見る
価格:11,631円
Extreme-Temperature and Harsh-Environment Electronics
著者:Vinod Kumar Khanna
出版社: Institute of Physics Publishing
発売日: 2017年03月30日
Electronic devices and circuits are employed by a range of industries in testing conditions from extremes of high- or low-temperature, in chemically corrosive environments, subject to shock and vibr……続きを見る
価格:20,218円
Practical Guide to RF-MEMS
著者:Jacopo Iannacci
出版社: Wiley
発売日: 2013年08月12日
Closes the gap between hardcore-theoretical and purely experimental RF-MEMS books. The book covers, from a practical viewpoint, the most critical steps that have to be taken in order to develop nove……続きを見る
価格:14,460円

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