商品件数:3 1件~3件 (1ページ中 1ページめ)
Active Probe Atomic Force Microscopy
著者:Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi
出版社: Springer International Publishing
発売日: 2024年03月09日
From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of m……続きを見る
価格:10,938円
Advanced Electromagnetic Models for Materials Characterization and Nondestructive Evaluation
著者:Harold A Sabbagh, R. Kim Murphy, Elias H. Sabbagh, Liming Zhou, Russell Wincheski
出版社: Springer International Publishing
発売日: 2021年04月20日
This book expands on the subject matter of ’Computational Electromagnetics and Model-Based Inversion: A Modern Paradigm for Eddy-Current Nondestructive Evaluation.’ It includes (a) voxel-based inver……続きを見る
価格:18,231円
The Border Effect in High-Precision Measurement
著者:Wei Zhou, Zhiqi Li, Lina Bai, Xiaoning Fu, Bayi Qu, Miao Miao
出版社: Springer Nature Singapore
発売日: 2023年03月01日
This book introduces various kinds of high-precision measurements, including the measurements of time and space, digital activity, border sensors and other physical quantities. Further, it demonstra……続きを見る
価格:18,231円

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